Software reliability analysis based on a nonhomogeneous error detection rate model
- 1 January 1984
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 24 (5) , 915-920
- https://doi.org/10.1016/0026-2714(84)90020-9
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Birth-Death and Bug CountingIEEE Transactions on Reliability, 1983
- Reliability growth models for hardware and software systems based on nonhomogeneous Poisson processes: A surveyMicroelectronics Reliability, 1983
- Theories of Software Reliability: How Good Are They and How Can They Be Improved?IEEE Transactions on Software Engineering, 1980
- Event-Altered Rate Models for General Reliability AnalysisIEEE Transactions on Reliability, 1979
- Optimum release time for software systems based on reliability and cost criteriaJournal of Systems and Software, 1979