Thickness monitoring of optical thin films
- 31 December 1979
- Vol. 29 (4-5) , 173-174
- https://doi.org/10.1016/s0042-207x(79)80749-6
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- The optical properties of thin films of cadmium and zinc selenides and telluridesJournal of Physics D: Applied Physics, 1976
- A new approach for the thickness monitoring of optical thin filmsVacuum, 1972
- The determination of the optical constants of thin films from measurements of reflectance and transmittance at normal incidenceJournal of Physics D: Applied Physics, 1972
- Refractive Index of ZnSe, ZnTe, and CdTeJournal of Applied Physics, 1964