SiSiO2 interface state spectroscopy using MOS tunneling structures
- 30 September 1979
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 22 (9) , 809-817
- https://doi.org/10.1016/0038-1101(79)90131-x
Abstract
No abstract availableThis publication has 40 references indexed in Scilit:
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