In situ observation of low temperature growth of crystalline silicon using reflection high-energy electron diffraction
- 1 May 2000
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 266-269, 64-68
- https://doi.org/10.1016/s0022-3093(99)00730-9
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
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