Specific applications of a 350 kv ion accelerator for PIXE analysis of solid state samples
- 1 April 1984
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 3 (1-3) , 130-134
- https://doi.org/10.1016/0168-583x(84)90349-5
Abstract
No abstract availableThis publication has 35 references indexed in Scilit:
- Defects in metals studied by implanted radioactive atomsNuclear Instruments and Methods, 1981
- Sensitivity in light element analysis by 2 MeV and 150 keV proton and photon induced X-raysNuclear Instruments and Methods, 1978
- A study on proton induced X-ray analysis and its application to environmental samplesNuclear Instruments and Methods, 1977
- Proton induced X-ray emission analysis of biological samples: Some approaches and applicationsNuclear Instruments and Methods, 1977
- Analytical application of particle induced X-ray emissionNuclear Instruments and Methods, 1976
- Analytical use of ion-induced X-raysJournal of Physics E: Scientific Instruments, 1975
- Elemental trace analysis of small samples by proton induced x-ray emissionAnalytical Chemistry, 1975
- Proton induced X-ray emission as a tool for trace element analysisNuclear Instruments and Methods, 1974
- Oxide-thickness determination by proton-induced x-ray fluorescenceJournal of Applied Physics, 1972
- Full-range solution for the measurement of thin-film surface densities with proton-excited x raysJournal of Applied Physics, 1972