Analytical use of ion-induced X-rays
- 1 June 1975
- journal article
- review article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 8 (6) , 429-444
- https://doi.org/10.1088/0022-3735/8/6/001
Abstract
Measuring the X-ray emission induced by energetic protons and alpha particles from accelerators has become a valuable tool for studying trace amounts of most elements, and is especially suited for small samples. Typical parameter ranges are ion energies of 0.1-10 MeV/u, concentrations down to 10-6-10-7 by weight, absolute amounts down to 10-9-10-12g, trace elements of Z>or=13. The technique is described, and is based on the use of solid state X-ray detectors. Use of heavy ions, microbeams and surface analysis are all considered. Advantages and limitations of the technique are discussed, and comparison is made with X-ray emission generated by photons and electrons. Fields of application are reviewed.Keywords
This publication has 59 references indexed in Scilit:
- Proton-induced X-ray analysis of steel surfaces for microprobe purposesNuclear Instruments and Methods, 1975
- Comparison of equal-velocity ion beams for elemental analysis by ion-excited X-ray emissionNuclear Instruments and Methods, 1974
- X-ray production by 1.5–11 MeV protonsThe European Physical Journal A, 1974
- Elemental analysis of whole blood using proton-induced x-ray emissionAnalytical Chemistry, 1974
- An ultrahigh vacuum system for ion-induced characteristic X-ray analysisThin Solid Films, 1973
- An assessment of ion-induced X-rays for analysisThin Solid Films, 1973
- Detection of firearm discharge residues by X-ray excitationJournal of Radioanalytical and Nuclear Chemistry, 1973
- Production ofandX Rays by Protons of 1.0-3.7 MeVPhysical Review A, 1973
- Characteristic X-ray production by heavy ion bombardment as a technique for the examination of solid surfacesSurface Science, 1973
- Excitation of Characteristic X Rays by Protons, Electrons, and Primary X RaysJournal of Applied Physics, 1964