Negative Ion Bombardment of Insulators to Alleviate Surface Charge-Up
- 1 July 1969
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 40 (8) , 3419-3420
- https://doi.org/10.1063/1.1658212
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Progress in analytic methods for the ion microprobe mass analyzerInternational Journal of Mass Spectrometry and Ion Physics, 1969
- Ion Microprobe Mass AnalyzerJournal of Applied Physics, 1967
- Cesium-Ion Bombardment of Aluminum Oxide in a Controlled Oxygen EnvironmentJournal of Applied Physics, 1967
- Kinetic Ejection of Electrons from SolidsPublished by Elsevier ,1966
- Étude d’une méthode d’analyse locale chimique et isotopique utilisant l’émission ionique secondaireAnnales de Physique, 1964
- Sputtering of Vitreous Silica by 20- to 60-kev Xe+ IonsJournal of Applied Physics, 1961