RHEED study of Nb thin film growth on α-Al2O3 (0001) substrate
- 1 April 1998
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 317 (1-2) , 183-188
- https://doi.org/10.1016/s0040-6090(97)00617-2
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Study of the growth of rhodium particles on different substratesThin Solid Films, 1995
- Subpixel detection in video RHEED image analysisThin Solid Films, 1995
- Bonding, structure, and properties of metal/ceramic interfaces: Part 1 Chemical bonding, chemical reaction, and interfacial structureInternational Materials Reviews, 1993
- Structure and defects of MBE grown NbAl2O3 interfacesActa Metallurgica et Materialia, 1992
- X-ray studies of misfit dislocations in the interface of epitaxial Nb films on sapphireActa Metallurgica et Materialia, 1992
- The characterization of NbAl2O3 and NbMgO interfaces in MBE grown NbMgONbAl2O3 multilayersActa Metallurgica et Materialia, 1992
- High-resolution electron microscopy studies of Nb/Al2O3 interfacesUltramicroscopy, 1990