Au–Si–Be Liquid Metal Ion Source for Maskless Ion Implantation
- 1 April 1983
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 22 (4A) , L225
- https://doi.org/10.1143/jjap.22.l225
Abstract
A new alloyed-liquid-metal ion source for ion implantation into III-V compound semiconductors has been developed. A ternary alloy consisting of Au, Si & Be is used as the liquid metal for this ion source which is capable of emitting p-type dopant (Be), n-type dopant (Si), and Au ions from a single emitter tip. Threshold voltage for emitting ion current is about 6 kV and Be++, Si++ and Au+ ions are dominant. Energy spreads of Be and Si ion beams are less than 10 eV, while that of Au was greater than 15 eV.Keywords
This publication has 4 references indexed in Scilit:
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