Hydrogen as a Probe of Semiconductor Surface Structure: The Ge(111)-c(2 × 8) Surface
- 10 January 1992
- journal article
- other
- Published by American Association for the Advancement of Science (AAAS) in Science
- Vol. 255 (5041) , 186-188
- https://doi.org/10.1126/science.255.5041.186
Abstract
Hydrogen can be used as an effective probe of the structure of semiconductor surfaces. Such surfaces consist of bonds with varying degrees of bond strain, and hydrogen can react with each selectively depending on the reaction conditions. This selectivity is derived from a reduced barrier to reaction associated with strained bonds. In this manner, hydrogen can be used to pick apart the surface one bond type at a time, thereby revealing the structure of even complex multilayer reconstructions. This method is used to directly show that the rest-layer of the Ge(111)-c(2 x 8) surface has a bulk structure.Keywords
This publication has 14 references indexed in Scilit:
- Role of bond-strain in the chemistry of hydrogen on the Si(100) surfaceSurface Science, 1992
- Charge transfer and asymmetry on Ge(111)-c(2×8) studied by scanning tunneling microscopyPhysical Review B, 1991
- The importance of structure and bonding in semiconductor surface chemistry: hydrogen on the Si(111)-7 × 7 surfaceSurface Science, 1991
- Nature of the hydride species on the hydrogenated silicon (111)-(7 .times. 7) surfaceThe Journal of Physical Chemistry, 1991
- Formation of Si(111)-(1×1)ClPhysical Review B, 1990
- In situ and real-time observation of optical constants of metal films during growthSurface Science, 1990
- Adatoms on Si(111) and Ge(111) surfacesPhysical Review B, 1989
- Scanning-tunneling-microscopy study of the Si(111)-7×7 rest-atom layer following adatom removal by reaction with ClPhysical Review Letters, 1989
- Dimer–adatom–stacking-fault (DAS) and non-DAS (111) semiconductor surfaces: A comparison of Ge(111)-c(2×8) to Si(111)-(2×2), -(5×5), -(7×7), and -(9×9) with scanning tunneling microscopyPhysical Review B, 1989
- Surfaces of siliconReports on Progress in Physics, 1987