Accuracy improvements in microwave noise parameter measurements
- 1 January 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 37 (12) , 1973-1978
- https://doi.org/10.1109/22.44110
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Noise modeling and measurement techniques (HEMTs)IEEE Transactions on Microwave Theory and Techniques, 1988
- Where Are My On-Wafer Reference Planes?Published by Institute of Electrical and Electronics Engineers (IEEE) ,1987
- Design of Microwave GaAs MESFET's for Broad-Band, Low-Noise Amplifier (Comments)IEEE Transactions on Microwave Theory and Techniques, 1986
- Measurement of Losses in Noise-Matching NetworksIEEE Transactions on Microwave Theory and Techniques, 1981
- Determination of Microwave Two-Port Noise Parameters Through Computer-Aided Frequency-Conversion TechniquesIEEE Transactions on Microwave Theory and Techniques, 1979
- An Improved Computational Method for Noise Parameter MeasurementIEEE Transactions on Microwave Theory and Techniques, 1979
- A Novel Procedure for Receiver Noise CharacterizationIEEE Transactions on Instrumentation and Measurement, 1973
- The determination of device noise parametersProceedings of the IEEE, 1969