Fault Detection and Design For Testability of CMOS Logic Circuits

This publication has 3 references indexed in Scilit:

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  IEEE Transactions on Computers, 1980
• Fault Modeling and Logic Simulation of CMOS and MOS Integrated Circuits
  Bell System Technical Journal, 1978
• Easily Testable Realizations ror Logic Functions
  IEEE Transactions on Computers, 1972