Effect of Total Dose Radiation on Device Self Latch-Up
- 24 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 1078621X,p. 88-89
- https://doi.org/10.1109/soi.1992.664808
Abstract
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This publication has 1 reference indexed in Scilit:
- A 0.5 mu m CMOS/SOI technologyPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002