Microprocessor systems testing — a review and future prospects
- 31 January 1979
- journal article
- review article
- Published by Elsevier in Euromicro Newsletter
- Vol. 5 (1) , 31-37
- https://doi.org/10.1016/0303-1268(79)90056-7
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Dynamic Testing of Control UnitsIEEE Transactions on Computers, 1978
- Fault Modeling and Logic Simulation of CMOS and MOS Integrated CircuitsBell System Technical Journal, 1978
- Processor Testability and Design ConsequencesIEEE Transactions on Computers, 1976
- Diagnosis of Automata Failures: A Calculus and a MethodIBM Journal of Research and Development, 1966