Discharge of MNOS structures at elevated temperatures
- 31 March 1976
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 19 (3) , 221-227
- https://doi.org/10.1016/0038-1101(76)90166-0
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Measurements of charge propagation in Si3N4 filmsApplied Physics Letters, 1974
- Trap-assisted charge injection in MNOS structuresJournal of Applied Physics, 1973
- Discharge of MNOS structuresSolid-State Electronics, 1973
- Characterization of thin-oxide MNOS memory transistorsIEEE Transactions on Electron Devices, 1972
- MNOS memory transistors in simple memory arraysIEEE Journal of Solid-State Circuits, 1972
- Properties of MNOS structuresIEEE Transactions on Electron Devices, 1972
- Poole-Frenkel conduction in amorphous solidsPhilosophical Magazine, 1971