Optical constants of transition-metal silicides
- 31 July 1983
- journal article
- Published by Elsevier in Materials Letters
- Vol. 2 (1) , 31-34
- https://doi.org/10.1016/0167-577x(83)90026-5
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Epitaxial silicidesThin Solid Films, 1982
- Resistivities of Thin Film Transition Metal SilicidesJournal of the Electrochemical Society, 1982
- Theoretical Considerations on Ion Channeling Effect through Silicide-Silicon InterfaceJapanese Journal of Applied Physics, 1981
- Optical Characterization of Tungsten Silicide Thin FilmsJournal of the Electrochemical Society, 1981
- Refractory silicides for integrated circuitsJournal of Vacuum Science and Technology, 1980