Lifetime control in silicon through impact sound stressing
- 16 August 1977
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 42 (2) , 553-564
- https://doi.org/10.1002/pssa.2210420218
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- A New Fast Technique for Large‐Scale Measurements of Generation Lifetime in SemiconductorsJournal of the Electrochemical Society, 1976
- Effect of Growth Rate on Stacking-Fault Density in Epitaxial Silicon LayersJournal of Applied Physics, 1964