A new method for the determination of the thickness, the optical constants and the relaxation time of weakly absorbing semiconducting thin films
- 30 November 1986
- journal article
- Published by Elsevier in Infrared Physics
- Vol. 26 (6) , 385-393
- https://doi.org/10.1016/0020-0891(86)90063-1
Abstract
No abstract availableKeywords
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