Defect Investigations in CdTe Crystals by RXT, SCL, and EBIC(V) Techniques
- 1 January 1981
- journal article
- research article
- Published by Wiley in Crystal Research and Technology
- Vol. 16 (2) , 175-181
- https://doi.org/10.1002/crat.19810160210
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- On X-ray and electron microscopic characterization of lattice defects in AIIBVI semiconductor compoundsPhysica Status Solidi (a), 1979
- CdTe Optical waveguide modulatorsRevue de Physique Appliquée, 1977
- Penetration and energy-loss theory of electrons in solid targetsJournal of Physics D: Applied Physics, 1972