Real-Time Femtosecond Ellipsometry of SixGe1−x Epilayers
- 1 January 1992
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Effects of Ge concentration on SiGe oxidation behaviorApplied Physics Letters, 1991
- Diffusion versus oxidation rates in silicon-germanium alloysApplied Physics Letters, 1991
- Optical control of growth of AlxGa1−xAs by organometallic molecular beam epitaxyApplied Physics Letters, 1990
- Subpicosecond time-resolved coherent-phonon oscillations in GaAsPhysical Review Letters, 1990