The application of the X-ray triple-crystal spectrometer for measuring the radius of curvature of bent single crystals
- 16 April 1976
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 34 (2) , 705-710
- https://doi.org/10.1002/pssa.2210340235
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Lattice Curvature in Nearly Perfect Silicon CrystalsZeitschrift für Naturforschung A, 1973
- Measurement of lattice parameter differences on semiconductor crystals due to diffusion dopingPhysica Status Solidi (a), 1973
- A modification of the theory of the triple crystal X-ray spectrometer and its application for practical calculationsPhysica Status Solidi (a), 1970
- X-ray measurement of elastic strain and annealing in semiconductorsSolid-State Electronics, 1970
- Proton Bombardment Damage in SiliconPhysica Status Solidi (b), 1965
- A contribution to the theory of the triple crystal diffractometerCzechoslovak Journal of Physics, 1961