Application of ellipsometry to oxidation studies of binary titanium-aluminum alloys
- 1 August 1969
- journal article
- Published by Elsevier in Surface Science
- Vol. 16, 390-397
- https://doi.org/10.1016/0039-6028(69)90034-x
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometryJournal of Research of the National Bureau of Standards Section A: Physics and Chemistry, 1963
- Optical Measurement of Oxide Thickness on Titanium*Journal of the Optical Society of America, 1962