Charge measurements in thin insulating layers of MIS and MIM structures by means of current–voltage characteristics and application to the MOS system
- 16 September 1977
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 43 (1) , 103-110
- https://doi.org/10.1002/pssa.2210430110
Abstract
No abstract availableKeywords
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