A new method for contrast correction with tilted samples in a scanning electron microscope
- 1 May 1976
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 9 (5) , 345-346
- https://doi.org/10.1088/0022-3735/9/5/009
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Some modifications of the scanning electron microscope for use in electron channelling patterns observationJournal of Physics E: Scientific Instruments, 1970
- Electron Channelling Patterns from Small (10 µm) Selected Areas in the Scanning Electron MicroscopeNature, 1970