Calibration of sputtering yields for AES depth profiling of oxide layers on aluminium by means of carrier-gas heat extraction analysis
- 1 January 1987
- journal article
- Published by Springer Nature in Analytical and Bioanalytical Chemistry
- Vol. 329 (2-3) , 174-179
- https://doi.org/10.1007/bf00469133
Abstract
No abstract availableKeywords
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