Digital deep level transient spectroscopy considered for discrimination of traps closely spaced in emission coefficients in semiconductors
- 1 March 1988
- journal article
- research article
- Published by Springer Nature in Journal of Electronic Materials
- Vol. 17 (2) , 187-191
- https://doi.org/10.1007/bf02652150
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Modulating Functions Waveform Analysis of Multi-Exponential Transients for Deep-Level Transient SpectroscopyMRS Proceedings, 1986
- The analysis of exponential and nonexponential transients in deep-level transient spectroscopyJournal of Applied Physics, 1981
- DLTS method using a single temperature scanningPhysica Status Solidi (a), 1981
- Deep-level transient spectroscopy: A new method to characterize traps in semiconductorsJournal of Applied Physics, 1974