Critical layer thickness in InzxGa1−xAs/GaAs quantum wells studied by photoluminescence and transmission electron microscopy
- 31 December 1991
- journal article
- Published by Elsevier in Superlattices and Microstructures
- Vol. 9 (1) , 123-126
- https://doi.org/10.1016/0749-6036(91)90107-3
Abstract
No abstract availableKeywords
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