Electric-field-modulated, infrared internal-reflection study of the silicon-electrolyte interface
- 1 August 1984
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 56 (3) , 843-849
- https://doi.org/10.1063/1.334019
Abstract
The electric-field modulation of the internal-reflection response of a Si-electrolyte interface is shown to give information both about accumulation of free carriers, interface states, and about molecular species in the oxide or in the Helmholtz or Gouy layer. Measurements were made in either a 0.1-M KOH or 0.1-M H2SO4 solution and evidence of electromodulation of vibration bands of H3O+, OH, and H2O was obtained.This publication has 30 references indexed in Scilit:
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