An Automated X-ray Microfluorescence Materials Analysis System
- 1 January 1988
- book chapter
- Published by Springer Nature
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Simultaneous, Nondestructive Analysis Of Thickness And Composition Of Multilayer Metal Films Using A Fundamental Parameter XRF Approach.Published by SPIE-Intl Soc Optical Eng ,1986
- Parameters Affecting X-Ray Microfluorescence (XRMF) AnalysisAdvances in X-ray Analysis, 1986
- An X-Ray Micro-Fluorescence Analysis System With Diffraction CapabilitiesAdvances in X-ray Analysis, 1985
- Fast Simultaneous Thickness Measurements of Gold and Nickel Layers on Copper SubstratesBell System Technical Journal, 1979
- Principles and Practice of X-Ray Spectrometric AnalysisPublished by Springer Nature ,1975