X-ray studies of covalent bonding in diamond and silicon
- 17 October 1967
- journal article
- Published by The Royal Society in Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences
- Vol. 301 (1465) , 195-209
- https://doi.org/10.1098/rspa.1967.0201
Abstract
A discussion is given of two methods used recently for studying the features of covalent bonding in diamond and silicon which are evident in accurate X-ray diffraction data. The numerical features of the approaches adopted by Weiss and Dawson are compared, and it is shown that only the latter’s approach permits adequate interpretation of the experimental evidence.This publication has 2 references indexed in Scilit:
- Absolute X-Ray Scattering Factors of Silicon and GermaniumPhysical Review B, 1965
- Charge density in diamondPhysics Letters, 1964