Electrical overstress (EOS) power profiles: A guideline to qualify EOS hardness of semiconductor devices
- 31 December 1993
- journal article
- Published by Elsevier in Journal of Electrostatics
- Vol. 31 (2) , 161-176
- https://doi.org/10.1016/0304-3886(93)90007-t
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
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- Thermal failure in semiconductor devicesSolid-State Electronics, 1990
- Determination of Threshold Failure Levels of Semiconductor Diodes and Transistors Due to Pulse VoltagesIEEE Transactions on Nuclear Science, 1968