Thermal failure in semiconductor devices
- 1 May 1990
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 33 (5) , 553-560
- https://doi.org/10.1016/0038-1101(90)90239-b
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Electrical Overstress Failure Modeling for Bipolar Semiconductor ComponentsIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1978
- Pulse Power Failure Modes in SemiconductorsIEEE Transactions on Nuclear Science, 1970
- Determination of Threshold Failure Levels of Semiconductor Diodes and Transistors Due to Pulse VoltagesIEEE Transactions on Nuclear Science, 1968
- Thermal breakdown in silicon p-n junction devicesIEEE Transactions on Electron Devices, 1966