Microhardness Measurement as a Quality Control Technique for Thin, Hard Coatings
- 1 January 1987
- journal article
- Published by SAGE Publications in Surface Engineering
- Vol. 3 (2) , 117-122
- https://doi.org/10.1179/sur.1987.3.2.117
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Hardness measurements of thin filmsThin Solid Films, 1984
- X‐Ray Fluorescence for Coating Thickness MeasurementCircuit World, 1983
- The hardness of solidsReview of Physics in Technology, 1970