Benefits of Integrated-Circuit Burn-In to Obtain High Reliability Parts
- 1 April 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. 35 (1) , 3-6
- https://doi.org/10.1109/tr.1986.4335327
Abstract
The technique of integrated circuit (IC) burn-in is applied industry-wide with the assumption that burned-in ICs have a much lower failure rate during operating life than ICs which are not burned-in. Several years ago this approach was valid for all ICs, but today burn-in procedures for some ICs provide little, if any, benefit. However, some customers still request burned-in ICs, assuming that this will produce better reliability. This paper provides historical data for linear ICs and presents a procedure to help the user determine if burn-in is worthwhile. An example for linear ICs where minimum benefit produced from burn-in is provided. By repeating this exercise with any other parts, the user can decide whether burn-in will decrease the failure rate appreciably for his application. This article deals specifically with decreases in failure rates through burn-in. It is not within the scope of this paper to describe general factors that could decrease failure rates.Keywords
This publication has 2 references indexed in Scilit:
- Quality, Reliability and Stress TestingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- PMOS Dynamic RAM Reliability = A Case Study8th Reliability Physics Symposium, 1979