Quality, Reliability and Stress Testing
- 25 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Practical Applications of Accelerated Testing - Introduction8th Reliability Physics Symposium, 1975
- Acceleration Factors for Environmental Life Testing of Integrated CircuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1971
- Electromigration Damage in Aluminum Film ConductorsJournal of Applied Physics, 1970
- Theory of the Failure of Semiconductor Contacts by ElectromigrationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1970