Image processing algorithms for the analysis of phase-shifted speckle interference patterns
- 1 May 1991
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 30 (13) , 1636-1641
- https://doi.org/10.1364/ao.30.001636
Abstract
A sequence of image processing algorithms for the analysis of interference patterns generated by a phase-shifting speckle interferometer is discussed. The goal is the accurate determination of displacement and strain components at the surface of an object. The phase change related to the displacement is accurately calculated from eight digitized interference patterns using a phase-shifting algorithm. Digital image processing algorithms have been developed for phase unwrapping, phase restoration, and phase fitting. During the processing steps a binary mask is used to solve the problem of invalid areas. Experimental results for the strain components at the surface of a simple object demonstrate a repeatability of 0.3-μstrain rms.Keywords
This publication has 8 references indexed in Scilit:
- Use of sensitivity vector variations to determine absolute displacements in double exposure hologram interferometryApplied Optics, 1990
- An efficient uniform cost algorithm applied to distance transformsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1989
- V Phase-Measurement Interferometry TechniquesPublished by Elsevier ,1988
- A contour processing method for fast binary neighbourhood operationsPattern Recognition Letters, 1988
- Digital phase stepping speckle interferometryOptics Communications, 1986
- Phase-shifting speckle interferometryApplied Optics, 1985
- Fringe scanning speckle-pattern interferometryApplied Optics, 1985
- De-correlation Effects in Speckle-pattern InterferometryOptica Acta: International Journal of Optics, 1977