STM combined with SEM without SEM capability limitations
- 31 July 1992
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 42-44, 1558-1563
- https://doi.org/10.1016/0304-3991(92)90483-z
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Reflection electron microscope imaging of an operating scanning tunneling microscopeJournal of Vacuum Science & Technology A, 1989
- Topographic imaging of GaAs-microstructured samples by STM and SEMUltramicroscopy, 1989
- Scanning tunneling and scanning electron microscopy investigations of nonuniform surfacesUltramicroscopy, 1988
- Combination of a scanning tunneling microscope with a scanning electron microscopeReview of Scientific Instruments, 1988
- SEM/STM combination for STM tip guidanceUltramicroscopy, 1988
- Scanning tunneling microscope combined with scanning electron microscopeUltramicroscopy, 1987
- Scanning tunneling microscope combined with a scanning electron microscopeReview of Scientific Instruments, 1986