Diffusion of paired hydrogen on Si(001)
- 15 April 1998
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 57 (15) , 8790-8793
- https://doi.org/10.1103/physrevb.57.8790
Abstract
An understanding of the diffusion of hydrogen on Si(001) is important in the gas-source growth of silicon and silicon-germanium alloys. We have imaged the saturated monohydride surface between 600 and 700 K using an elevated-temperature scanning tunneling microscope (STM), and have observed the concerted diffusion of pairs of hydrogen atoms along the dimer rows. The barrier for this process has been estimated from the STM data to be Using our experimental images, we have narrowed down the mechanism to two possible routes, which we have modeled with tight binding. Only one of these routes has a barrier (1.98 eV) which is consistent with the experiment, leading to a conclusive identification of the diffusion mechanism.
Keywords
This publication has 6 references indexed in Scilit:
- High-pressure Raman scattering of the stretching mode in nitrogen along the 300-K isothermPhysical Review B, 1996
- Effects of hydrogen impurities on the diffusion, nucleation, and growth of Si on Si(001)Physical Review B, 1995
- Adsorption, Abstraction, and Pairing of Atomic Hydrogen on Si(100)-Physical Review Letters, 1995
- An atomically resolved scanning tunneling microscopy study of the thermal decomposition of disilane on Si(001)Surface Science, 1994
- Pairing of hydrogen atoms on the Si(100)-(2×1) surface: The role of interactions among dimersPhysical Review B, 1994
- Scanning tunnelling microscopy of the interaction of hydrogen with silicon surfacesAdvances in Physics, 1993