Electron probe microanalysis on electron microscope thin foils using thin standards
- 1 November 1970
- journal article
- letter
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 3 (11) , L70-L72
- https://doi.org/10.1088/0022-3727/3/11/103
Abstract
Electron probe microanalysis, associated with electron microscopy, of thin foils of gold-silver alloys has been made using thin foils of pure elements as standards. Theoretical bases are discussed. Specimens and standards were prepared by vaporization in vacuum and their thickness accurately measured. The anomalous emission effect does not seem to introduce errors in these experiments.Keywords
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