Noise Generation of a Switching Regulator
- 1 January 1978
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Aerospace and Electronic Systems
- Vol. AES-14 (1) , 178-184
- https://doi.org/10.1109/taes.1978.308592
Abstract
Analytical and experimental considerations on the surge and noise generated in a typical switching regulator are discussed. There are two kinds of surges which occur in the switching instants of the transistor. These surges appear as high voltages across the semiconductor elements and decrease their reliabilities. Corresponding to the surge generation, noise voltages appear in the output terminals and may induce malfunctions of a signal processing device connected to the regulator. We analyze these surge and noise voltages by means of high-frequency equivalent circuits.Keywords
This publication has 3 references indexed in Scilit:
- Rapid Testing for Noise Immunity of Electron DevicesIEEE Transactions on Reliability, 1976
- The Cascade Connection of Switching RegulatorsIEEE Transactions on Industry Applications, 1976
- Design of two-winding voltage step-up/current step-up constant-frequency DC-to-DC convertersIEEE Transactions on Magnetics, 1973