Characterization of the (0001) surface of ice Ih crystal by crystal truncation rod scattering with the use of a synchrotron radiation source
- 1 July 1992
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 121 (3) , 360-364
- https://doi.org/10.1016/0022-0248(92)90145-9
Abstract
No abstract availableKeywords
Funding Information
- Ministry of Education, Culture, Sports, Science and Technology (90-086)
This publication has 9 references indexed in Scilit:
- Vapor growth mechanism of a crystal surface covered with a quasi-liquid layer — Effect of self-diffusion coefficient of the quasi-liquid layer on the growth rateJournal of Crystal Growth, 1990
- X-ray measurements of the crystal truncation rod scattering from cleavage surfaces of ionic crystalsSurface Science, 1989
- High Resolution Investigation of the Rod-Shaped Scattering from a (111) Si Surface by a Synchrotron Radiation SourceJapanese Journal of Applied Physics, 1987
- Ellipsometric study of the transition layer on the surface of an ice crystalJournal of Crystal Growth, 1987
- Crystal truncation rods and surface roughnessPhysical Review B, 1986
- Scattering of X-rays from crystal surfacesJournal of Physics C: Solid State Physics, 1985
- Growth kinetics of ice from the vapour phase and its growth formsJournal of Crystal Growth, 1982
- Separate measurements of dynamical and kinematical X-ray diffractions from silicon crystals with a triple crystal diffractometerPhysica Status Solidi (a), 1979
- Concentric dislocation loops with [0001] burgers vectors in ice single crystals doped with NH3Philosophical Magazine, 1971