Photodetection by barrier modulation in Cu-diffused Au/CdS junctions

Abstract
Modulation of essentially thermionic forward current by light‐induced lowering of an electrostatic barrier leads to steady‐state electron per photon gain of order 106 in narrow Cu‐compensated Au/CdS junctions. The light dependence of the barrier, whose peak lies within the semiconductor, is measured directly by internal photoemission. A model of the junction is presented and the limiting threshold and gain of this type of device is estimated.

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