The effect of oxygen on the structure of annealed w/c multilayer thin films

This publication has 7 references indexed in Scilit:

• Raman scattering as a diagnostic technique for cathode characterization
  IEEE Transactions on Electron Devices, 1987
• Anomalous expansion of tungsten-carbon multilayers used in x-ray optics
  Journal of Applied Physics, 1986
• X-ray characterization of amorphous multilayers
  Scripta Metallurgica, 1986
• Amorphous carbon
  Advances in Physics, 1986
• Use of Raman scattering to investigate disorder and crystallite formation in as-deposited and annealed carbon films
  Physical Review B, 1984
• Layered synthetic microstructures as Bragg diffractors for X rays and extreme ultraviolet: theory and predicted performance
  Applied Optics, 1981
• “Diamond-like” 3-fold coordinated amorphous carbon
  Journal of Non-Crystalline Solids, 1980