Failure mechanisms in thin film field effect transistors
- 31 October 1966
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 9 (10) , 911-919
- https://doi.org/10.1016/0038-1101(66)90066-9
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Charge storage effects in silicon dioxide filmsIEEE Transactions on Electron Devices, 1965
- Space-Charge Model for Surface Potential Shifts in Silicon Passivated with Thin Insulating LayersIBM Journal of Research and Development, 1964
- Theory of the space-charge-limited surface-channel dielectric triodeSolid-State Electronics, 1964
- Behavior of CdS thin film transistorsSolid-State Electronics, 1964
- Mobile electric charges on insulating oxides with application to oxide covered silicon p-n junctionsSurface Science, 1964
- Thermoelectric properties of non-stoichiometric bismuth-antimony-telluride alloysSolid-State Electronics, 1963
- Charge transfer controlled surface interactions between oxygen and CdSe filmsJournal of Physics and Chemistry of Solids, 1963
- Oxygen Sorption Phenomena on Cadmium Selenide CrystalsThe Journal of Chemical Physics, 1957
- Comparison of Surface-Excited and Volume-Excited Photoconduction in Cadmium Sulfide CrystalsPhysical Review B, 1956
- Surface Properties of GermaniumBell System Technical Journal, 1953