z calibration of the atomic force microscope by means of a pyramidal tip
- 1 September 1993
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 64 (9) , 2595-2597
- https://doi.org/10.1063/1.1143873
Abstract
A new method for imaging the probe tip of an atomic force microscope cantilever by the atomic force microscope itself (self‐imaging) is presented. The self‐imaging is accomplished by scanning the probe tip across a sharper tip on the surface. By using a pyramidal probe tip with a very well‐defined aspect ratio, this technique provides an excellent z‐calibration standard for the atomic force microscope.Keywords
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