Cathodoluminescence Scanning Microscopy
- 16 October 1992
- journal article
- review article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 133 (2) , 189-230
- https://doi.org/10.1002/pssa.2211330202
Abstract
No abstract availableThis publication has 59 references indexed in Scilit:
- Scanning cathodoluminescence microscopy: A unique approach to atomic-scale characterization of heterointerfaces and imaging of semiconductor inhomogeneitiesJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1991
- Spatial resolution of cathodoluminescence scanning electron microscopy of semiconductorsScanning, 1991
- Cathodoluminescence Microscopy of Inorganic SolidsPublished by Springer Nature ,1990
- Observations of Hg0.7Cd0.3Te epilayers by infrared cathodoluminescence detectionScanning, 1990
- Interface structure and optical properties of quantum wells and quantum boxesJournal of Vacuum Science & Technology B, 1987
- Local cathodoluminescence and its capabilities for the study of band structure in solidsUspekhi Fizicheskih Nauk, 1986
- Kinetics of relaxation and recombination of nonequilibrium carriers in GaAs: Carrier capture by impuritiesPhysical Review B, 1985
- Application of a new detector for cathodoluminescence measurements in the wavelength range to 1.8 μmScanning, 1985
- Advances in the electrical assessment of semiconductors using the scanning electron microscopeJournal of Microscopy, 1980
- Improved cathodoluminescence microscopyJournal of Microscopy, 1974