Characterization of the structural, electronic and tribological properties of metal dichalcogenides by scanning probe microscopies
- 1 December 1991
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 206 (1-2) , 355-359
- https://doi.org/10.1016/0040-6090(91)90450-c
Abstract
No abstract availableThis publication has 20 references indexed in Scilit:
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