Density of states of grain boundaries in silicon
- 1 May 1982
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 42 (6) , 415-417
- https://doi.org/10.1016/0038-1098(82)90962-0
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Complex nature of gold-related deep levels in siliconPhysical Review B, 1980
- Electrical properties of polycrystalline GaAs filmsJournal of Applied Physics, 1980
- Characterization of grain boundaries using deep level transient spectroscopyJournal of Applied Physics, 1979
- Grain boundary states and varistor behavior in silicon bicrystalsApplied Physics Letters, 1979
- Deep Level Impurities in SemiconductorsAnnual Review of Materials Science, 1977