Thermal and residual stresses of Czochralski-grown semiconducting material
- 1 January 1986
- journal article
- Published by Elsevier in International Journal of Solids and Structures
- Vol. 22 (3) , 307-314
- https://doi.org/10.1016/0020-7683(86)90094-6
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- A Thermoelastic Analysis of Dislocation Generation in Pulled GaAs CrystalsBell System Technical Journal, 1980
- The cracking of Czochralski-grown crystalsJournal of Crystal Growth, 1977
- Dislocation density in pure crystals grown from meltsCrystal Research and Technology, 1975