Mechanical component reliability under environmental stress
- 1 January 1980
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 20 (1-2) , 153-160
- https://doi.org/10.1016/0026-2714(80)90533-8
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Stress—strength reliability modelsMicroelectronics Reliability, 1980
- Reliability analysis of mechanical components and systemsNuclear Engineering and Design, 1972